NNF Staff Contacts : Nicole Hedges and Phil Barletta
HP 4280A 1MHz C Meter/ C-V Plotter
HP 54520A 500MSa/s 500MHz Oscilloscope
HP 4156A Precision Semiconductor Parameter Analyzer
HP 6623A System DC Power Supply
This anechoic chamber provides a low reflection environment to measure antenna radiation pattern, gain, and reflection coefficient from 0.7 – 18 GHz. It can also serve a shielded room for wireless testing.