Characterization
NNF Staff Contacts : Nicole Hedges and Phil Barletta
FIB Scanning Electron Microscope
Location: Room 127
JEOL EBL
Location: JEOL Bay (210)
Anechoic Chamber
Location: Room 226
This anechoic chamber provides a low reflection environment to measure antenna radiation pattern, gain, and reflection coefficient from 0.7 – 18 GHz. It can also serve a shielded room for wireless testing.