NNF Staff Contacts : Nicole Hedges and Phil Barletta

Probe Station

Characterization Equipment

HP 4280A 1MHz C Meter/ C-V Plotter

HP 54520A 500MSa/s 500MHz Oscilloscope

HP 4156A Precision Semiconductor Parameter Analyzer

HP 6623A System DC Power Supply

Anechoic Chamber

This anechoic chamber provides a low reflection environment to measure antenna radiation pattern, gain, and reflection coefficient from 0.7 – 18 GHz.  It can also serve a shielded room for wireless testing.